ASTM E2444-11e1 Historical

1840744

Terminology Relating to Measurements Taken on Thin, Reflecting Films

standard by ASTM International , 10/15/2011

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Full Description

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

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Document History

  1. ASTM E2444-11(2018)


    Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films

    • Most Recent

  2. ASTM E2444-11e1

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    Terminology Relating to Measurements Taken on Thin, Reflecting Films

    • Historical Version

  3. ASTM E2444-11


    Terminology Relating to Measurements Taken on Thin, Reflecting Films

    • Historical Version

  4. ASTM E2444-05e1


    Terminology Relating to Measurements Taken on Thin, Reflecting Films

    • Historical Version

  5. ASTM E2444-05


    Terminology Relating to Measurements Taken on Thin, Reflecting Films

    • Historical Version

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Product Details

Published:

10/15/2011

Number of Pages:

2