ECIA EIA-469-F Historical [ Revised ]

This document provides terminology, suggested methods, and criteria for characterizing the internal structural features of monolithic, ceramic dielectric capacitors. Its major objective is the accurate evaluation of the internal physical quality of the chip capacitor element as it relates to the functional reliability of the finished capacitor. This Standard also provides needed and useful information pertaining to activities associated with destructive physical analysis (DPA), such as visual inspection and DPA reporting. In addition, it provides tutorial help for problems inherent in DPA sample processing.

Purpose

This specification is primarily applicable to multilayer ceramic chip capacitors. It also contains criteria for radial and axially leaded multilayer ceramic capacitors but is not intended to define lead attachment criteria for other styles of leaded ceramic capacitors such as stacked, leaded capacitors with DIP (dual inline package) lead frames.

DPA is only one test contributing to the complete evaluation of a product lot regarding its fitness for use and its conformance to design and performance specifications. Information from other tests, such as initial electrical testing, voltage conditioning and other electrical and environmental testing that may be imposed, should be considered as well as DPA results. DPA should not be used in place of electrical testing for determining lot quality.

Representative DPA sampling

A DPA sample shall represent no more than one chip lot, since the probability of internal structural anomalies in chip elements often is associated with a chip lot because of some process or material variation, explained or unexplained, which may have affected only the lot in question.

The DPA sample shall be a group of parts that is randomly drawn from a lot that is ready for acceptance testing in accordance with the procurement document.

Sampling plan

A sampling plan purposely has been omitted from this Standard. The number of sample specimens to be subjected to DPA shall be the responsibility of the procurement agency and shall be specified in a document of that agency, in the purchase order, or in a contract with a supplier. If the purchase order does not specify a sampling plan when invoking this Standard, the plan given in MIL-PRF-123/4.6.2/Table XIV, General Specification for High Reliability, Fixed, Ceramic Dielectric Capacitors (Temperature Stable and General Purpose), may be used, or the supplier may specify an appropriate sampling plan.