IPC 9261 Historical

957497

In-Process DPMO and Estimated Yield for PWAs

standard by IPC by Global Electronics Association , 03/01/2002

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Full Description

This document defines consistent methodologies for computation of in-process defects per million opportunities (DPMO) metrics for any evaluation stage in the assembly process. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC-7912. A guide to defect categorization is provided that can serve as a base for summarizing and reporting in-process defects when used with J-STD-001 and IPC-A-610. It can also be used to develop process step estimated yield - the expected percentage of assemblies with no defects for a particular process step or combined process steps, based on historical defect rates. See more

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  1. IPC 9261A


    In-Process DPMO and Estimated Yield for PCAs

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  2. IPC 9261

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    In-Process DPMO and Estimated Yield for PWAs

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Product Details

Published:

03/01/2002

ANSI:

ANSI Approved

Number of Pages:

24

File Size:

1 file

Product Code(s):

9261(D)1, 9261(D)1

Note:

This product is restricted and cannot be purchased in the following countries Russia, Ukraine, Belarus