ISO 11505:2025 ✓ Most Recent

2996473

Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

standard by International Organization for Standardization , 06/01/2025

Track This

Full Description

This document specifies a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

The applicability of this document is limited to description of general procedures for quantification of the chemical composition and thickness in GD-OES compositional depth profiling. This document is not directly applicable for quantification of individual materials having various thicknesses and elements to be determined.

See more

Also Bought By Customers

 

Document History

  1. ISO 11505:2025

    👀 currently
    viewing


    Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

    • Most Recent

  2. ISO 11505:2012


    Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

    • Historical Version

Order Options

Delivery Options
Price: $201.00
Available for Immediate Download

Product Details

Published:

06/01/2025

File Size:

1 file

Note:

This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus