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  1. Home
  2. ISO 15529:2010

ISO 15529:2010 ✓ Most Recent

1734157

Optics and photonics - Optical transfer function - Principles of measurement of modulation transfer function (MTF) of sampled imaging systems

standard by International Organization for Standardization , 08/01/2010

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Identical Versions Available

  • BS ISO 15529:2010

    October 2010
    Optics and photonics. Optical transfer function. Principles of measurement of modulation transfer function (MTF) of sampled imaging systems

    • This is the most recent version of this document.
  • DIN ISO 15529

    November 2010
    Optics and photonics - Optical transfer function - Principles of measurement of modulation transfer function (MTF) of sampled imaging systems (ISO 15529:2010)

Full Description

ISO 15529:2010 specifies the principal MTFs associated with a sampled imaging system, together with related terms, and outlines a number of suitable techniques for measuring these MTFs. It also defines a measure for the “aliasing” related to imaging with such systems.

ISO 15529:2010 is particularly relevant to electronic imaging devices such as digital still and video cameras and the detector arrays they embody.

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Document History

  1. ISO 15529:2010

    You are currently viewing this product 👀 currently
    viewing

    August 2010
    Optics and photonics - Optical transfer function - Principles of measurement of modulation transfer function (MTF) of sampled imaging systems

    • Most Recent  Most Recent
  2. ISO 15529:2007

    September 2007
    Optics and photonics - Optical transfer function - Principles of measurement of modulation transfer function (MTF) of sampled imaging systems

    • Historical Version
  3. ISO 15529:1999

    August 1999
    Optics and optical instruments - Optical transfer function - Principles of measurement of modulation transfer function (MTF) of sampled imaging systems

    • Historical Version

Browse related products from International Organization for Standardization

  • International Organization for Standardization > By ICS Code > 17: Metrology and measurement. Physical phenomena > 17.180: Optics and optical measurements > 17.180.01: Optics and optical measurements in general
  • International Organization for Standardization > By Technical Committee > TC 172: Optics and photonics > TC 172/SC 1: Fundamental standards

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Price: $172.00
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Product Details

Published:

08/01/2010

File Size:

1 file

Same As:

BS ISO 15529:2010, DIN ISO 15529

Note:

This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus
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