ISO 29301:2023 ✓ Most Recent

2575553

Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures

standard by International Organization for Standardization , 10/01/2023

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Full Description

This document specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon.

This document is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. This document also refers to the calibration of a scale bar.

This document does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM).

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Document History

  1. ISO 29301:2023

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    Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures

    • Most Recent

  2. ISO 29301:2017


    Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures

    • Historical Version

  3. ISO 29301:2010


    Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures

    • Historical Version

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Published:

10/01/2023

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1 file

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This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus