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  1. Home
  2. JEDEC JEP122G

JEDEC JEP122G Historical

1817519

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

standard by JEDEC Solid State Technology Association , 10/01/2011

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Full Description

This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum-of-the-Failure-Rates method. See more

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Document History

  1. JEDEC JEP122H

    September 2016
    Failure Mechanisms and Models for Semiconductor Devices

    • Most Recent  Most Recent
  2. JEDEC JEP122G

    You are currently viewing this product 👀 currently
    viewing

    October 2011
    FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

    • Historical Version
  3. JEDEC JEP 122F

    November 2010
    FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

    • Historical Version
  4. JEDEC JEP 122E

    March 2009
    FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

    • Historical Version

Browse related products from JEDEC Solid State Technology Association

  • JEDEC Solid State Technology Association > JC-14: Quality and Reliability of Solid State Products > JC-14.1: Reliability Test Methods for Packaged Devices

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Product Details

Published:

10/01/2011

Number of Pages:

108

File Size:

1 file , 2.1 MB

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This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus
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