IEC 60749-11 Ed. 1.0 b:2002 ✓ Most Recent

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Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

standard by International Electrotechnical Commission , 04/12/2002

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Full Description

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. See more

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Amendments, rulings, supplements, and errata

  1. IEC 60749-11 Ed. 1.0 b COR. 2:2003

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    Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

  2. IEC 60749-11 Ed. 1.0 b COR. 1:2003

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    Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

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Product Details

Edition:

1.0

Published:

04/12/2002

Number of Pages:

13

File Size:

1 file

Note:

This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus