IEC 60749-26 Ed. 1.0 b:2003 Historical [ Withdrawn ]

1134084

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

standard by International Electrotechnical Commission , 10/21/2003

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Full Description

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the machine model test method (see IEC 60749-27). See more

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Document History

  1. IEC 60749-26 Ed. 4.0 b:2018


    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

    • Most Recent

  2. IEC 60749-26 Ed. 3.0 b:2013


    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

    • Historical Version

  3. IEC 60749-26 Ed. 2.0 b:2006


    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

    • Historical Version

  4. IEC 60749-26 Ed. 1.0 b:2003

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    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

    • Historical Version

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Product Details

Edition:

1.0

Published:

10/21/2003

Number of Pages:

27

File Size:

1 file

Note:

This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus