31.080.01: Semiconductor Devices In General

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  1. HISTORICAL

    ASTM F1190-18▹

    This document has been replaced. View the most recent version.

    Standard Guide for Neutron Irradiation of Unbiased Electronic Components

    standard by ASTM International, 03/01/2018.

    Languages:

    Historical Editions: ASTM F1190-24, ASTM F1190-11, ASTM F1190-99(2005), ASTM F1190-99, ASTM F1190-93

  2. ASTM F1190-24▹

    Standard Guide for Neutron Irradiation of Unbiased Electronic Components

    standard by ASTM International, 05/01/2024.

    Languages:

    Historical Editions: ASTM F1190-18, ASTM F1190-11, ASTM F1190-99(2005), ASTM F1190-99, ASTM F1190-93

  3. HISTORICAL

    ASTM F1190-93▹

    This document has been replaced. View the most recent version.

    Standard Guide for Neutron Irradiation of Unbiased Electronic Components

    standard by ASTM International, 01/01/1993.

    Languages:

    Historical Editions: ASTM F1190-24, ASTM F1190-18, ASTM F1190-11, ASTM F1190-99(2005), ASTM F1190-99

  4. HISTORICAL

    ASTM F1190-99▹

    This document has been replaced. View the most recent version.

    Standard Guide for Neutron Irradiation of Unbiased Electronic Components

    standard by ASTM International, 01/10/1999.

    Languages:

    Historical Editions: ASTM F1190-24, ASTM F1190-18, ASTM F1190-11, ASTM F1190-99(2005), ASTM F1190-93

  5. HISTORICAL

    ASTM F1190-99(2005)▹

    This document has been replaced. View the most recent version.

    Standard Guide for Neutron Irradiation of Unbiased Electronic Components

    standard by ASTM International, 01/01/2005.

    Languages:

    Historical Editions: ASTM F1190-24, ASTM F1190-18, ASTM F1190-11, ASTM F1190-99, ASTM F1190-93

  6. HISTORICAL

    ASTM F1192-00▹

    This document has been replaced. View the most recent version.

    Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

    standard by ASTM International, 06/10/2000.

    Languages:

    Historical Editions: ASTM F1192-24, ASTM F1192-11(2018), ASTM F1192-11, ASTM F1192-00(2006)

  7. HISTORICAL

    ASTM F1192-00(2006)▹

    This document has been replaced. View the most recent version.

    Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

    standard by ASTM International, 07/01/2006.

    Languages:

    Historical Editions: ASTM F1192-24, ASTM F1192-11(2018), ASTM F1192-11, ASTM F1192-00

  8. HISTORICAL

    ASTM F1192-11▹

    This document has been replaced. View the most recent version.

    Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

    standard by ASTM International, 10/01/2011.

    Languages:

    Historical Editions: ASTM F1192-24, ASTM F1192-11(2018), ASTM F1192-00(2006), ASTM F1192-00

  9. HISTORICAL

    ASTM F1192-11(2018)▹

    This document has been replaced. View the most recent version.

    Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

    standard by ASTM International, 03/01/2018.

    Languages:

    Historical Editions: ASTM F1192-24, ASTM F1192-11, ASTM F1192-00(2006), ASTM F1192-00

  10. ASTM F1192-24▹

    Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

    standard by ASTM International, 05/01/2024.

    Languages:

    Historical Editions: ASTM F1192-11(2018), ASTM F1192-11, ASTM F1192-00(2006), ASTM F1192-00