31.200: Integrated Circuits. Microelectronics

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  1. HISTORICAL

    ASTM F1262M-95(2002)▹

    This document has been replaced. View the most recent version.

    Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits

    standard by ASTM International, 12/10/2002.

    Languages:

    Historical Editions: ASTM F1262M-14, ASTM F1262M-95(2008), ASTM F1262M-95

  2. HISTORICAL

    ASTM F1513-99▹

    This document has been replaced. View the most recent version.

    Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications

    standard by ASTM International, 12/10/1999.

    Languages:

    Historical Editions: ASTM F1513-99(2011), ASTM F1513-99(2003)

  3. HISTORICAL

    ASTM F1513-99(2003)▹

    This document has been replaced. View the most recent version.

    Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications

    standard by ASTM International, 01/01/2003.

    Languages:

    Historical Editions: ASTM F1513-99(2011), ASTM F1513-99

  4. ASTM F1513-99(2011)▹ [ Withdrawn ]

    Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications (Withdrawn 2020)

    standard by ASTM International, 06/01/2011.

    Languages:

    Historical Editions: ASTM F1513-99(2003), ASTM F1513-99

  5. ASTM F744M-16▹ [ Withdrawn ]

    Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)

    standard by ASTM International, 05/01/2016.

    Languages:

    Historical Editions: ASTM F744M-10, ASTM F744M-97(2003), ASTM F744M-97

  6. HISTORICAL

    ASTM F744M-97▹

    This document has been replaced. View the most recent version.

    Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits

    standard by ASTM International, 01/01/1997.

    Languages:

    Historical Editions: ASTM F744M-16, ASTM F744M-10, ASTM F744M-97(2003)

  7. ASTM F773M-16▹ [ Withdrawn ]

    Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023)

    standard by ASTM International, 05/01/2016.

    Languages:

    Historical Editions: ASTM F773M-10, ASTM F773M-96(2003), ASTM F773M-96

  8. HISTORICAL

    ASTM F773M-96▹

    This document has been replaced. View the most recent version.

    Practice for Measuring Dose Rate Response of Linear Integrated Circuits

    standard by ASTM International, 06/10/1996.

    Languages:

    Historical Editions: ASTM F773M-16, ASTM F773M-10, ASTM F773M-96(2003)