Test Instrumentation and Techniques

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  1. MOST RECENT

    IEEE 1641.1a-2018▹

    IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language

    Amendment by IEEE, 08/15/2018.

    Languages: English

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  2. HISTORICAL

    IEEE 1641-2004▹

    This document has been replaced. View the most recent version.

    IEEE Standard for Signal and Test Definition

    standard by IEEE, 03/25/2005.

    Languages: English

    Historical Editions: IEEE 1641-2022, IEEE 1641-2010

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  3. HISTORICAL

    IEEE 1641-2010▹

    This document has been replaced. View the most recent version.

    IEEE Standard for Signal and Test Definition

    standard by IEEE, 09/17/2010.

    Languages: English

    Historical Editions: IEEE 1641-2022, IEEE 1641-2004

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  4. MOST RECENT

    IEEE 1641-2022▹

    IEEE Standard for Signal and Test Definition

    standard by IEEE, 02/10/2023.

    Languages: English

    Historical Editions: IEEE 1641-2010, IEEE 1641-2004

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  5. HISTORICAL

    IEEE 1671.1-2009▹

    This document has been replaced. View the most recent version.

    IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

    standard by IEEE, 12/11/2009.

    Languages: English

    Historical Editions: IEEE 1671.1-2017

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  6. HISTORICAL

    IEEE 1671-2006▹

    This document has been replaced. View the most recent version.

    IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

    standard by IEEE, 12/15/2006.

    Languages: English

    Historical Editions: IEEE/IEC 61671-2012, IEEE 1671-2010

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  7. HISTORICAL

    IEEE 1671-2010▹

    This document has been replaced. View the most recent version.

    IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

    standard by IEEE, 01/20/2011.

    Languages: English

    Historical Editions: IEEE/IEC 61671-2012, IEEE 1671-2006

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  8. HISTORICAL

    IEEE 1671.2-2008▹

    This document has been replaced. View the most recent version.

    IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions

    standard by IEEE, 12/17/2008.

    Languages: English

    Historical Editions: IEEE 1671.2-2012

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  9. HISTORICAL

    IEEE 1671.3-2007▹

    This document has been replaced. View the most recent version.

    IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information

    standard by IEEE, 03/28/2008.

    Languages: English

    Historical Editions: IEEE 1671.3-2017

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  10. HISTORICAL

    IEEE 1671.4-2007▹

    This document has been replaced. View the most recent version.

    IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information

    standard by IEEE, 04/30/2008.

    Languages: English

    Historical Editions: IEEE 1671.4-2014

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