31.080.30: Transistors

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  1. HISTORICAL

    IEEE 1005-1991▹

    This document has been replaced. View the most recent version.

    IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays

    standard by IEEE, 10/17/1991.

    Languages: English

    Historical Editions: IEEE 1005-1998

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  2. MOST RECENT

    IEEE 1005-1998▹ [ Withdrawn ]

    IEEE Standard for Definitions, Symbols, and Characterization of Floating Gate Memory Arrays

    standard by IEEE, 02/09/1999.

    Languages: English

    Historical Editions: IEEE 1005-1991

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  3. MOST RECENT

    IEEE 1620.1-2006▹

    IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

    standard by IEEE, 11/08/2006.

    Languages: English

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  4. HISTORICAL

    IEEE 1620-2004▹

    This document has been replaced. View the most recent version.

    Standard for Test Methods for the Characterization of Organic Transistors and Materials

    standard by IEEE, 04/29/2004.

    Languages: English

    Historical Editions: IEEE 1620-2008

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  5. MOST RECENT

    IEEE 1620-2008▹

    IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

    standard by IEEE, 12/05/2008.

    Languages: English

    Historical Editions: IEEE 1620-2004

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  6. MOST RECENT

    IEEE 581-1978▹ [ Withdrawn ]

    IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors

    standard by IEEE, 04/28/1978.

    Languages: English

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  7. IEEE/IEC 62860-1-2013▹

    IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators

    standard by IEEE/IEC, 07/30/2013.

    Languages: English

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  8. IEEE/IEC 62860-2013▹

    IEC/IEEE Test methods for the characterization of organic transistors and materials

    standard by IEEE/IEC, 07/30/2013.

    Languages: English

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