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  1. Home
  2. IEC 60747-11 Ed. 1.0 b:1985

IEC 60747-11 Ed. 1.0 b:1985 ✓ Most Recent [ Withdrawn ]

748917  Preview

Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

standard by International Electrotechnical Commission , 01/01/1985

📝 Amendments Available

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Full Description

Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices. See more

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Amendments, rulings, supplements, and errata

  1. IEC 60747-11 Amd.2 Ed. 1.0 b:1996

    May 1996
    Amendment 2 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

  2. IEC 60747-11 Amd.1 Ed. 1.0 b:1991

    November 1991
    Amendment 1 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

Browse related products from International Electrotechnical Commission

  • International Electrotechnical Commission > By ICS Code > 31: Electronics > 31.080: Semiconductor devices > 31.080.01: Semiconductor devices in general
  • International Electrotechnical Commission > By Technical Committee > TC 47: Semiconductor devices > SC 47E: Discrete semiconductor devices

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Price: $97.00
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Product Details

Edition:

1.0

Published:

01/01/1985

Number of Pages:

35

File Size:

1 file

Note:

This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus
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