SC 47E: Discrete semiconductor devices

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  1. MOST RECENT

    IEC 60747-10 Amd.3 Ed. 2.0 b:1996▹ [ Withdrawn ]

    Amendment 3 - Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

    Amendment by International Electrotechnical Commission, 08/23/1996.

    Languages: English,French

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  2. MOST RECENT

    IEC 60747-10 Ed. 2.0 b:1991▹ [ Withdrawn ]

    Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

    standard by International Electrotechnical Commission, 05/21/1991.

    Languages: English,French

    Amendments, rulings, and supplements: IEC 60747-10 Amd.3 Ed. 2.0 b:1996

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  3. MOST RECENT

    IEC 60747-11 Amd.1 Ed. 1.0 b:1991▹ [ Withdrawn ]

    Amendment 1 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

    Amendment by International Electrotechnical Commission, 11/01/1991.

    Languages: English,French

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  4. MOST RECENT

    IEC 60747-11 Amd.2 Ed. 1.0 b:1996▹ [ Withdrawn ]

    Amendment 2 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

    Amendment by International Electrotechnical Commission, 05/22/1996.

    Languages: English,French

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  5. MOST RECENT

    IEC 60747-11 Ed. 1.0 b:1985▹ [ Withdrawn ]

    Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

    standard by International Electrotechnical Commission, 01/01/1985.

    Languages: English,French

    Amendments, rulings, and supplements: IEC 60747-11 Amd.2 Ed. 1.0 b:1996, IEC 60747-11 Amd.1 Ed. 1.0 b:1991

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  6. MOST RECENT

    IEC 60747-14-10 Ed. 1.0 b:2019▹

    Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors

    standard by International Electrotechnical Commission, 11/13/2019.

    Languages: English,French

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  7. MOST RECENT

    IEC 60747-14-11 Ed. 1.0 en:2021▹

    Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

    standard by International Electrotechnical Commission, 03/03/2021.

    Languages: English

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  8. HISTORICAL

    IEC 60747-14-1 Ed. 1.0 en:2000▹ [ Withdrawn ]

    This document has been replaced. View the most recent version.

    Semiconductor devices - Part 14-1: Semiconductor sensors - General and classification

    standard by International Electrotechnical Commission, 10/27/2000.

    Languages: English

    Historical Editions: IEC 60747-14-1 Ed. 2.0 b:2010

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  9. MOST RECENT

    IEC 60747-14-1 Ed. 2.0 b:2010▹

    Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors

    standard by International Electrotechnical Commission, 01/21/2010.

    Languages: English,French

    Historical Editions: IEC 60747-14-1 Ed. 1.0 en:2000

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  10. MOST RECENT

    IEC 60747-14-2 Ed. 1.0 en:2000▹

    Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements

    standard by International Electrotechnical Commission, 11/09/2000.

    Languages: English

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