IEC 60749-5 Ed. 2.0 b:2017 Historical

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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

standard by International Electrotechnical Commission , 04/10/2017

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Full Description

IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a)   correction of an error in an equation;
b)   inclusion of notes for guidance;
c)   clarification of the applicability of test conditions.
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Document History

  1. IEC 60749-5 Ed. 3.0 b:2023


    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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  2. IEC 60749-5 Ed. 2.0 b:2017

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    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

    • Historical Version

  3. IEC 60749-5 Ed. 2.0 en:2017


    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

    • Historical Version

  4. IEC 60749-5 Ed. 1.0 b:2003


    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

    • Historical Version

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Product Details

Edition:

2.0

Published:

04/10/2017

Number of Pages:

18

File Size:

1 file

Note:

This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus