JC-14.2: Wafer-Level Reliability

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  1. MOST RECENT

    JEDEC JEP001-3B

    FOUNDRY PROCESS QUALIFICATION GUIDELINES – TECHNOLOGY QUALIFICATION VEHICLE TESTING (Wafer Fabrication Manufacturing Sites)

    standard by JEDEC Solid State Technology Association, 09/01/2024.

    Languages: English

    Historical Editions: JEDEC JEP001-3A

    Priced From:

  2. MOST RECENT

    JEDEC JEP119A

    A PROCEDURE FOR EXECUTING SWEAT

    standard by JEDEC Solid State Technology Association, 08/01/2003.

    Languages: English

  3. MOST RECENT

    JEDEC JEP128

    GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTING

    standard by JEDEC Solid State Technology Association, 11/01/1996.

    Languages: English

  4. MOST RECENT

    JEDEC JEP139

    GUIDELINE FOR CONSTANT TEMPERATURE AGING TO CHARACTERIZE ALUMINUM INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING

    standard by JEDEC Solid State Technology Association, 12/01/2000.

    Languages: English

  5. MOST RECENT

    JEDEC JEP199

    Procedure for Reliability Characterization of Metal-Insulator-Metal Capacitors

    standard by JEDEC Solid State Technology Association, 04/01/2024.

    Languages: English

    Priced From:

  6. MOST RECENT

    JEDEC JESD202

    METHOD FOR CHARACTERIZING THE ELECTROMIGRATION FAILURE TIME DISTRIBUTION OF INTERCONNECTS UNDER CONSTANT-CURRENT AND TEMPERATURE STRESS

    standard by JEDEC Solid State Technology Association, 03/01/2006.

    Languages: English

  7. MOST RECENT

    JEDEC JESD263

    Gate Dielectric Breakdown

    standard by JEDEC Solid State Technology Association, 03/01/2024.

    Languages: English

    Priced From:

  8. MOST RECENT

    JEDEC JESD28-1

    N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS

    standard by JEDEC Solid State Technology Association, 09/01/2001.

    Languages: English

  9. MOST RECENT

    JEDEC JESD28-A

    A PROCEDURE FOR MEASURING N-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION UNDER DC STRESS

    standard by JEDEC Solid State Technology Association, 12/01/2001.

    Languages: English

  10. MOST RECENT

    JEDEC JESD33-B

    STANDARD METHOD FOR MEASURING AND USING THE TEMPERATURE COEFFICIENT OF RESISTANCE TO DETERMINE THE TEMPERATURE OF A METALLIZATION LINE

    standard by JEDEC Solid State Technology Association, 02/01/2004.

    Languages: English