TC 202/SC 1: Terminology

Search Results

  1. MOST RECENT

    ISO 15932:2013

    Microbeam analysis - Analytical electron microscopy - Vocabulary

    standard by International Organization for Standardization, 12/15/2013.

    Languages: English

  2. MOST RECENT

    ISO 17297:2025

    Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary

    standard by International Organization for Standardization, 05/01/2025.

    Languages: English

  3. HISTORICAL

    ISO 22493:2008

    This document has been replaced. View the most recent version.

    Microbeam analysis - Scanning electron microscopy - Vocabulary

    standard by International Organization for Standardization, 10/01/2008.

    Languages: English

    Historical Editions: ISO 22493:2014

  4. MOST RECENT

    ISO 22493:2014

    Microbeam analysis - Scanning electron microscopy - Vocabulary

    standard by International Organization for Standardization, 04/15/2014.

    Languages: English

    Historical Editions: ISO 22493:2008

  5. HISTORICAL

    ISO 23833:2006

    This document has been replaced. View the most recent version.

    Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary

    standard by International Organization for Standardization, 12/01/2006.

    Languages: English

    Historical Editions: ISO 23833:2013

  6. MOST RECENT

    ISO 23833:2013

    Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary

    standard by International Organization for Standardization, 04/15/2013.

    Languages: English

    Historical Editions: ISO 23833:2006